（2） Element class detection

Baijia.net - a professional third-party testing and inspection platform that provides related testing and inspection services such as element testing

Elements refer to over a hundred basic metallic and non-metallic substances in nature, composed of only one atom with the same number of protons in its nucleus, which cannot be decomposed by ordinary chemical methods and can form all substances. Examples of common elements include hydrogen, nitrogen, and carbon

 

Metal element testing

Project category elements: heavy metal elements: lead Pb, chromium Cr, mercury Hg, arsenic As, cadmium Cd, hexavalent chromium Cr6+precious metal elements: gold, Au, silver Ag, platinum Pt, osmium Os, iridium Ir, ruthenium Ru, rhodium Rh, palladium Pd metal elements: lithium Li, beryllium Be, sodium Na, magnesium Mg, aluminum Al, potassium K, calcium Ca, scandium Sc, Ti, vanadium V, chromium Cr, manganese Mn, iron Fe, cobalt Co, nickel Ni, copper Cu, zinc Zn, Gallium Ga, germanium Ge, rubidium Rb, strontium Sr, yttrium Y, zirconium Zr, niobium Nb Molybdenum Mo, indium In, tin Sn, antimony Sb, tellurium Te, cesium Cs, barium Ba, hafnium Hf, tungsten W, rhenium Re, thallium Tl, bismuth Bi, selenium Se and its oxides Rare earth metal elements La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Y, Sc and their oxides, Total Rare Earth Metal Elements Full Scan XRF-X-ray Fluorescence Spectrometer Element Full Scan Test, Non destructive testing

Non metallic element testing

Test element testing methods/standard halogen: fluorine F, chlorine Cl, bromine Br, iodine I oxygen bomb IC, potentiometric titration/BS EN 14582:2007 carbon C, hydrogen H, oxygen O, nitrogen N, sulfur S oxygen nitrogen analyzer, carbon sulfur analyzer, organic element analyzer boron B, silicon Si Phosphorus P Inductively Coupled Plasma Emission Spectrometer ICP-OES Spectroscopy UV Vis

Anion and cation Testing

Project Category Elements Common Anions Phosphate Ion PO43-, Formate Ion HCOO -, Acetate (Acetate) Ion Ac -, Oxalate Ion C2O42-, Nitrate Ion NO3-, Nitrite Ion NO2-, Sulfate Ion SO42-, Fluoride Ion F -, Chloride Ion Cl -, Bromine Ion Br -, Iodine Ion I -  Common cationic sodium ions Na+, potassium ions K+, calcium ions Ca2+, magnesium ions Mg2+, ammonium ions NH4+

Surface element analysis

 

When paying attention to some chemical information on the surface of the sample, surface analysis techniques are used. Currently, surface analysis involves instruments such as scanning electron microscopy energy dispersive spectroscopy (SEM-EDS), X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), etc. Scanning electron microscopy energy dispersive spectroscopy (SEM-EDS) can observe the surface morphology of samples, analyze surface elements, observe cross-sectional morphology, and analyze cross-sectional elements. The analysis depth is generally at the micrometer (10-6m) level. X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) can perform surface element analysis, surface longitudinal element analysis, surface element valence state resolution, and analysis depth is usually at the nanometer (10-9m) level on samples

 

Isotope Analysis

Isotope Testing Instrument 14C Age Determination Accelerated Mass Spectrometer 13C, 15N, 18O, D Tritium Stable Isotope Mass Spectrometer 6LI, 10B Isotope Inductively Coupled Plasma Mass Spectrometer

Radioactive Element Detection

Project Category Elements Natural Radionuclide Limit Radium-226, Thorium-232, Potassium 40, Uranium-238 γ Radiation dose rate/total radiation amount/total water quality radioactivity α， total β

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